A BJT-Based CMOS Temperature Sensor Achieving an Inaccuracy of pm 0.45C(3) from °50°C to 180°C and a Resolution-FoM of 7.2pJ.K2at 150°C

Bo Wang, Man Kay Law, Amine Bermak

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

10 Citations (Scopus)

Abstract

Integrated temperature sensors for industrial digital transformation such as turbine and bearing monitoring should exhibit low power consumption and high energy efficiency with moderate inaccuracy over a wide sensing range (e.g., > 150°C) to achieve autonomous operation under a limited energy budget. Even though resistor-based temperature sensors can achieve a superior sub-pJ.K2 resolution-FoM [1], they typically require a 2-point trim together with a high-order nonlinearity correction (6th-order in [2]), inevitably burdening the processing cost. In contrast, BJT-based temperature sensors in bulk or SOI CMOS can achieve accurate sensing at high temperature with only 1-point trim and simple digital processing [3], [4]. However, they can suffer from a degraded energy efficiency at high temperature for ensuring the sensing resolution and/or accuracy (e.q., 3× increase in bias current for improving the 3-inaccuracy from pm 0.6C to pm 0.4C in [3]). This paper describes a BJT-based temperature sensor capable of wide-range operation from -50°C to 180°C. By employing a nonlinear readout and the proposed subranging, double-sampling, and constant-biasing techniques, this work achieves a high resolution-FoM over the entire sensing range (9.7pJ.K2 at room temperature and 7.2pJ.K2 at 150°C), corresponding to a 6-to-10× improvement when compared with prior BJT-based wide-range designs [3], [4]. We further employ dynamic error-correction [5] and switch-leakage compensation to effectively suppress the mismatch- and leakage-induced errors, resulting in a high precision of pm 0.46C(3).

Original languageEnglish
Title of host publication2022 IEEE International Solid-State Circuits Conference, ISSCC 2022
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages72-74
Number of pages3
ISBN (Electronic)9781665428002
DOIs
Publication statusPublished - 2022
Event2022 IEEE International Solid-State Circuits Conference, ISSCC 2022 - San Francisco, United States
Duration: 20 Feb 202226 Feb 2022

Publication series

NameDigest of Technical Papers - IEEE International Solid-State Circuits Conference
Volume2022-February
ISSN (Print)0193-6530

Conference

Conference2022 IEEE International Solid-State Circuits Conference, ISSCC 2022
Country/TerritoryUnited States
CitySan Francisco
Period20/02/2226/02/22

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