TY - GEN
T1 - A CMOS image sensor with reconfigurable resolution for energy harvesting applications
AU - Shi, Chao
AU - Law, Man Kay
AU - Bermak, Amine
PY - 2009
Y1 - 2009
N2 - In this paper, we propose a CMOS image sensor with reconfigurable resolution for energy harvesting applications such as video sensor networks. Depending on the available energy, the spatial resolution of the imager can be adaptively reconfigured to save energy for other units on the sensor node. In contrast to early attempts of energy harvesting image sensor, we propose an asynchronous sensor in which the photodetector itself within the pixel can be used as an energy harvesting device, so that the total available energy will be increased. Low power operation is achieved since the time-to-first spike (TFS) pixel only fires once per frame. Utilizing address-event-representation, the imager can make efficient use of the output bandwidth. System architecture and operation are discussed together with the simulation results. Measurement results for a test structure fabricated in standard 0.35μm CMOS process are also provided. A system model is developed to illustrate the effectiveness of the proposed approach.
AB - In this paper, we propose a CMOS image sensor with reconfigurable resolution for energy harvesting applications such as video sensor networks. Depending on the available energy, the spatial resolution of the imager can be adaptively reconfigured to save energy for other units on the sensor node. In contrast to early attempts of energy harvesting image sensor, we propose an asynchronous sensor in which the photodetector itself within the pixel can be used as an energy harvesting device, so that the total available energy will be increased. Low power operation is achieved since the time-to-first spike (TFS) pixel only fires once per frame. Utilizing address-event-representation, the imager can make efficient use of the output bandwidth. System architecture and operation are discussed together with the simulation results. Measurement results for a test structure fabricated in standard 0.35μm CMOS process are also provided. A system model is developed to illustrate the effectiveness of the proposed approach.
UR - http://www.scopus.com/inward/record.url?scp=77951126322&partnerID=8YFLogxK
U2 - 10.1109/ICSENS.2009.5398193
DO - 10.1109/ICSENS.2009.5398193
M3 - Conference contribution
AN - SCOPUS:77951126322
SN - 9781424445486
T3 - Proceedings of IEEE Sensors
SP - 197
EP - 200
BT - IEEE Sensors 2009 Conference - SENSORS 2009
T2 - IEEE Sensors 2009 Conference - SENSORS 2009
Y2 - 25 October 2009 through 28 October 2009
ER -