A column-parallel inverter-based cyclic ADC for CMOS image sensor with capacitance and clock scaling

Keyphrases

• Parallel Inverters 100%
• Cyclic Analog-to-digital Converter 100%
• Least Significant Bit 66%
• Bit Quantization 33%
• Capacitance Scaling 33%
• Column-parallel Analog-to-digital Converter 33%
• Sensor Readout Circuit 33%
• Integral Nonlinearity 33%
• Quantization Level 33%
• Ignorable 33%
• Sampling Rate 33%
• Downscaling 33%
• Resolution Test 33%
• Cycle Period 33%
• Settling Speed 33%
• Noise Performance 33%
• Effective number of Bits 33%

Engineering

• Sampling Rate 25%
• Cycle Period 25%
• Noise Performance 25%