TY - GEN
T1 - A New read-out circuit for low power current and voltage mediated integrating CMOS imager
AU - Bermak, Amine
AU - Boussaïd, Farid
AU - Bouzerdoum, Abdesselam
PY - 2004
Y1 - 2004
N2 - This paper proposes a new read-out strategy for integrating type of CMOS imagers. The approach uses a single counter and two address decoders for generating both the reset and the selection signals needed for an integrating image sensor array together with the electronic shutter functionality. In contrast to the traditional integrating read-out approaches, our reset and read-out phases are carried out simultaneously. The array is scanned with only a single pixel selected for reset and another pixel selected for read-out. This approach results in significant benefits such as silicon area savings, low power operation, simple electronic shutter as well as equal and programmable integration time for all pixels within the array. The functionality of the proposed approach and its VLSI implementation is illustrated using the example of the current-mediated image sensor proposed by McIlrath et al. in [1].
AB - This paper proposes a new read-out strategy for integrating type of CMOS imagers. The approach uses a single counter and two address decoders for generating both the reset and the selection signals needed for an integrating image sensor array together with the electronic shutter functionality. In contrast to the traditional integrating read-out approaches, our reset and read-out phases are carried out simultaneously. The array is scanned with only a single pixel selected for reset and another pixel selected for read-out. This approach results in significant benefits such as silicon area savings, low power operation, simple electronic shutter as well as equal and programmable integration time for all pixels within the array. The functionality of the proposed approach and its VLSI implementation is illustrated using the example of the current-mediated image sensor proposed by McIlrath et al. in [1].
UR - http://www.scopus.com/inward/record.url?scp=4544348946&partnerID=8YFLogxK
U2 - 10.1109/DELTA.2004.10064
DO - 10.1109/DELTA.2004.10064
M3 - Conference contribution
AN - SCOPUS:4544348946
SN - 0769520812
SN - 9780769520810
T3 - Proceedings, DELTA 2004 - Second IEEE International Workshop on Electronic Design, Test and Applications
SP - 35
EP - 40
BT - Proceedings, DELTA 2004 - Second IEEE International Workshop on Electronic Design, Test and Applications
T2 - Proceedings, DELTA 2004 - Second IEEE International Workshop on Electronic Design, Test and Applications
Y2 - 28 January 2004 through 30 January 2004
ER -