TY - GEN
T1 - A smart CMOS image sensor with on-chip hot pixel correcting readout circuit for biomedical applications
AU - Cao, Yuan
AU - Tang, Fang
AU - Bermak, Amine
AU - Le, Thinh M.
PY - 2010
Y1 - 2010
N2 - One of the most recent and exciting applications for CMOS image sensors is in the biomedical field. In such applications, these sensors often operate in harsh environments (high intensity, high pressure, long time exposure), which increase the probability for the occurrence of hot pixel defects over their lifetime. This paper presents a novel smart CMOS image sensor integrating hot pixel correcting readout circuit to preserve the quality of the captured images. With this approach, no. extra non-volatile memory is required in the sensor device to store the locations of the hot pixels. In addition, the reliability of the sensor is ensured by maintaining a realtime detection of hot pixels during image capture.
AB - One of the most recent and exciting applications for CMOS image sensors is in the biomedical field. In such applications, these sensors often operate in harsh environments (high intensity, high pressure, long time exposure), which increase the probability for the occurrence of hot pixel defects over their lifetime. This paper presents a novel smart CMOS image sensor integrating hot pixel correcting readout circuit to preserve the quality of the captured images. With this approach, no. extra non-volatile memory is required in the sensor device to store the locations of the hot pixels. In addition, the reliability of the sensor is ensured by maintaining a realtime detection of hot pixels during image capture.
KW - Biomedical applications
KW - CMOS image sensor
KW - Hot pixel correction
UR - http://www.scopus.com/inward/record.url?scp=77952389543&partnerID=8YFLogxK
U2 - 10.1109/DELTA.2010.36
DO - 10.1109/DELTA.2010.36
M3 - Conference contribution
AN - SCOPUS:77952389543
SN - 9780769539782
T3 - Proceedings - 5th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2010
SP - 103
EP - 107
BT - Proceedings - 5th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2010
T2 - 5th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2010
Y2 - 13 January 2010 through 15 January 2010
ER -