TY - GEN
T1 - Architecture of a low storage digital pixel sensor array with an on-line block-based compression
AU - Zhang, Milin
AU - Bermak, Amine
PY - 2008
Y1 - 2008
N2 - In this paper, a block-based architecture of digital pixel sensor (DPS) array integrated with an on-line compression algorithm is proposed. The proposed technique is based on a block divided storage and compression scheme of the original image. Image capture, storage, and reordering are completed simultaneously and performed on-line while storing pixel value into the on-chip memory array. More than 60% of memory saving is achieved using the proposed block-based design. Furthermore, block-based design greatly reduces the accumulation error inherent in DPCM type of processing. Simulation results show that the PSNR result can reach around 30dB with a compression ratio of less than 3BPP.
AB - In this paper, a block-based architecture of digital pixel sensor (DPS) array integrated with an on-line compression algorithm is proposed. The proposed technique is based on a block divided storage and compression scheme of the original image. Image capture, storage, and reordering are completed simultaneously and performed on-line while storing pixel value into the on-chip memory array. More than 60% of memory saving is achieved using the proposed block-based design. Furthermore, block-based design greatly reduces the accumulation error inherent in DPCM type of processing. Simulation results show that the PSNR result can reach around 30dB with a compression ratio of less than 3BPP.
KW - Block-based compression
KW - DPS
KW - Error propagation
KW - Low storage
UR - http://www.scopus.com/inward/record.url?scp=50649093332&partnerID=8YFLogxK
U2 - 10.1109/DELTA.2008.117
DO - 10.1109/DELTA.2008.117
M3 - Conference contribution
AN - SCOPUS:50649093332
SN - 0769531105
SN - 9780769531106
T3 - Proceedings - 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008
SP - 167
EP - 170
BT - Proceedings - 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008
T2 - 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008
Y2 - 23 January 2008 through 25 January 2008
ER -