Abstract
CdTe films were deposited by closed space sublimation from different CdTe:Bi targets (from non-doped up to 0.16at.%) previously sintered by the Bridgman method. X-ray diffraction measurements demonstrate that CdTe films are formed and Bi is incorporated. Electrical and optical characterizations show that thin films reproduce the bulk material behaviour with a decrease in resistivity and an increase in photoconductivity. Also a limit is found in the increase of photoconductivity properties versus Bi concentration.
Original language | English |
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Article number | 011 |
Pages (from-to) | 7163-7169 |
Number of pages | 7 |
Journal | Journal of Physics Condensed Matter |
Volume | 18 |
Issue number | 31 |
DOIs | |
Publication status | Published - 9 Aug 2006 |
Externally published | Yes |