Capacitance measurements for subcell characterization in multijunction solar cells

Carmen M. Ruiz; Ignacio Rey-Stolle; Iván Garcia; Enrique Barrigón; Pilar Espinet; V. Bermúdez; Carlos Algora

doi:10.1109/PVSC.2010.5617045

Capacitance measurements for subcell characterization in multijunction solar cells

Carmen M. Ruiz, Ignacio Rey-Stolle, Iván Garcia, Enrique Barrigón, Pilar Espinet, V. Bermúdez, Carlos Algora

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

7 Citations (Scopus)

Abstract

On this paper we present an alternative way to analyze de electronic properties of each subcell from the complete device. By illuminating the cell with light sources which energy is near one of the subcell bandgaps, it is possible to "erase" the presence of such subcell on the CV curve. The main advantages of this technique are that it is not destructive, it can be measured on the complete cell so can be easily implemented as a diagnostic technique for controlling electronic deviations.

Original language	English
Title of host publication	Program - 35th IEEE Photovoltaic Specialists Conference, PVSC 2010
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	708-711
Number of pages	4
ISBN (Print)	9781424458912
DOIs	https://doi.org/10.1109/PVSC.2010.5617045
Publication status	Published - 2010
Externally published	Yes

Publication series

Name	Conference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)	0160-8371

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10.1109/PVSC.2010.5617045

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Ruiz, C. M., Rey-Stolle, I., Garcia, I., Barrigón, E., Espinet, P., Bermúdez, V., & Algora, C. (2010). Capacitance measurements for subcell characterization in multijunction solar cells. In Program - 35th IEEE Photovoltaic Specialists Conference, PVSC 2010 (pp. 708-711). Article 5617045 (Conference Record of the IEEE Photovoltaic Specialists Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2010.5617045

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title = "Capacitance measurements for subcell characterization in multijunction solar cells",

abstract = "On this paper we present an alternative way to analyze de electronic properties of each subcell from the complete device. By illuminating the cell with light sources which energy is near one of the subcell bandgaps, it is possible to {"}erase{"} the presence of such subcell on the CV curve. The main advantages of this technique are that it is not destructive, it can be measured on the complete cell so can be easily implemented as a diagnostic technique for controlling electronic deviations.",

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series = "Conference Record of the IEEE Photovoltaic Specialists Conference",

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Ruiz, CM, Rey-Stolle, I, Garcia, I, Barrigón, E, Espinet, P, Bermúdez, V & Algora, C 2010, Capacitance measurements for subcell characterization in multijunction solar cells. in Program - 35th IEEE Photovoltaic Specialists Conference, PVSC 2010., 5617045, Conference Record of the IEEE Photovoltaic Specialists Conference, Institute of Electrical and Electronics Engineers Inc., pp. 708-711. https://doi.org/10.1109/PVSC.2010.5617045

Capacitance measurements for subcell characterization in multijunction solar cells. / Ruiz, Carmen M.; Rey-Stolle, Ignacio; Garcia, Iván et al.
Program - 35th IEEE Photovoltaic Specialists Conference, PVSC 2010. Institute of Electrical and Electronics Engineers Inc., 2010. p. 708-711 5617045 (Conference Record of the IEEE Photovoltaic Specialists Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Ruiz, Carmen M.

AU - Rey-Stolle, Ignacio

AU - Garcia, Iván

AU - Barrigón, Enrique

AU - Espinet, Pilar

AU - Bermúdez, V.

AU - Algora, Carlos

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AB - On this paper we present an alternative way to analyze de electronic properties of each subcell from the complete device. By illuminating the cell with light sources which energy is near one of the subcell bandgaps, it is possible to "erase" the presence of such subcell on the CV curve. The main advantages of this technique are that it is not destructive, it can be measured on the complete cell so can be easily implemented as a diagnostic technique for controlling electronic deviations.

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PB - Institute of Electrical and Electronics Engineers Inc.

ER -

Ruiz CM, Rey-Stolle I, Garcia I, Barrigón E, Espinet P, Bermúdez V et al. Capacitance measurements for subcell characterization in multijunction solar cells. In Program - 35th IEEE Photovoltaic Specialists Conference, PVSC 2010. Institute of Electrical and Electronics Engineers Inc. 2010. p. 708-711. 5617045. (Conference Record of the IEEE Photovoltaic Specialists Conference). doi: 10.1109/PVSC.2010.5617045

Capacitance measurements for subcell characterization in multijunction solar cells

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