Combined Raman scattering/photoluminescence analysis of Cu(In,Ga)Se2 electrodeposited layers

C. Insignares-Cuello; V. Izquierdo-Roca; J. López-García; L. Calvo-Barrio; E. Saucedo; S. Kretzschmar; T. Unold; C. Broussillou; T. Goislard de Monsabert; V. Bermudez; A. Pérez-Rodríguez

doi:10.1016/j.solener.2014.02.005

Combined Raman scattering/photoluminescence analysis of Cu(In,Ga)Se₂ electrodeposited layers

C. Insignares-Cuello^*, V. Izquierdo-Roca, J. López-García, L. Calvo-Barrio, E. Saucedo, S. Kretzschmar, T. Unold, C. Broussillou, T. Goislard de Monsabert, V. Bermudez, A. Pérez-Rodríguez

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

17 Citations (Scopus)

Abstract

This work reports the optical non-destructive assessment of the relative Ga content in Cu(In,Ga)Se₂ absorbers synthesized from electrodeposited precursors using combined photoluminescence (PL) and Raman scattering. Comparison of the PL measurements with the Auger Spectroscopy characterization of the layers has allowed performing a calibration of the dependence of the PL peak energy on the absorber composition. This opens the possibility for the nondestructive chemical assessment of the absorbers synthesized with these low cost processes. Extension of these measurements using a confocal microscope demonstrates their viability for the nondestructive quantitative chemical profiling of the layers. Correlation of these data with Raman spectra measured with the same experimental setup allows deepening in the interpretation of the spectra, giving additional information related to the microcrystalline quality of the layers and the presence of secondary phases.

Original language	English
Pages (from-to)	89-95
Number of pages	7
Journal	Solar Energy
Volume	103
DOIs	https://doi.org/10.1016/j.solener.2014.02.005
Publication status	Published - May 2014
Externally published	Yes

Keywords

Confocal microscopy
Cu(In,Ga)Se
Photoluminescence
Process monitoring
Raman scattering
Thin film cells

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10.1016/j.solener.2014.02.005

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Insignares-Cuello, C., Izquierdo-Roca, V., López-García, J., Calvo-Barrio, L., Saucedo, E., Kretzschmar, S., Unold, T., Broussillou, C., Goislard de Monsabert, T., Bermudez, V., & Pérez-Rodríguez, A. (2014). Combined Raman scattering/photoluminescence analysis of Cu(In,Ga)Se₂ electrodeposited layers. Solar Energy, 103, 89-95. https://doi.org/10.1016/j.solener.2014.02.005

@article{8876836c44f64f7fa4d193bd32ba89bc,

title = "Combined Raman scattering/photoluminescence analysis of Cu(In,Ga)Se2 electrodeposited layers",

abstract = "This work reports the optical non-destructive assessment of the relative Ga content in Cu(In,Ga)Se2 absorbers synthesized from electrodeposited precursors using combined photoluminescence (PL) and Raman scattering. Comparison of the PL measurements with the Auger Spectroscopy characterization of the layers has allowed performing a calibration of the dependence of the PL peak energy on the absorber composition. This opens the possibility for the nondestructive chemical assessment of the absorbers synthesized with these low cost processes. Extension of these measurements using a confocal microscope demonstrates their viability for the nondestructive quantitative chemical profiling of the layers. Correlation of these data with Raman spectra measured with the same experimental setup allows deepening in the interpretation of the spectra, giving additional information related to the microcrystalline quality of the layers and the presence of secondary phases.",

keywords = "Confocal microscopy, Cu(In,Ga)Se, Photoluminescence, Process monitoring, Raman scattering, Thin film cells",

author = "C. Insignares-Cuello and V. Izquierdo-Roca and J. L{\'o}pez-Garc{\'i}a and L. Calvo-Barrio and E. Saucedo and S. Kretzschmar and T. Unold and C. Broussillou and {Goislard de Monsabert}, T. and V. Bermudez and A. P{\'e}rez-Rodr{\'i}guez",

year = "2014",

month = may,

doi = "10.1016/j.solener.2014.02.005",

language = "English",

volume = "103",

pages = "89--95",

journal = "Solar Energy",

issn = "0038-092X",

publisher = "Elsevier Ltd",

}

Insignares-Cuello, C, Izquierdo-Roca, V, López-García, J, Calvo-Barrio, L, Saucedo, E, Kretzschmar, S, Unold, T, Broussillou, C, Goislard de Monsabert, T, Bermudez, V & Pérez-Rodríguez, A 2014, 'Combined Raman scattering/photoluminescence analysis of Cu(In,Ga)Se₂ electrodeposited layers', Solar Energy, vol. 103, pp. 89-95. https://doi.org/10.1016/j.solener.2014.02.005

TY - JOUR

T1 - Combined Raman scattering/photoluminescence analysis of Cu(In,Ga)Se2 electrodeposited layers

AU - Insignares-Cuello, C.

AU - Izquierdo-Roca, V.

AU - López-García, J.

AU - Calvo-Barrio, L.

AU - Saucedo, E.

AU - Kretzschmar, S.

AU - Unold, T.

AU - Broussillou, C.

AU - Goislard de Monsabert, T.

AU - Bermudez, V.

AU - Pérez-Rodríguez, A.

PY - 2014/5

Y1 - 2014/5

N2 - This work reports the optical non-destructive assessment of the relative Ga content in Cu(In,Ga)Se2 absorbers synthesized from electrodeposited precursors using combined photoluminescence (PL) and Raman scattering. Comparison of the PL measurements with the Auger Spectroscopy characterization of the layers has allowed performing a calibration of the dependence of the PL peak energy on the absorber composition. This opens the possibility for the nondestructive chemical assessment of the absorbers synthesized with these low cost processes. Extension of these measurements using a confocal microscope demonstrates their viability for the nondestructive quantitative chemical profiling of the layers. Correlation of these data with Raman spectra measured with the same experimental setup allows deepening in the interpretation of the spectra, giving additional information related to the microcrystalline quality of the layers and the presence of secondary phases.

AB - This work reports the optical non-destructive assessment of the relative Ga content in Cu(In,Ga)Se2 absorbers synthesized from electrodeposited precursors using combined photoluminescence (PL) and Raman scattering. Comparison of the PL measurements with the Auger Spectroscopy characterization of the layers has allowed performing a calibration of the dependence of the PL peak energy on the absorber composition. This opens the possibility for the nondestructive chemical assessment of the absorbers synthesized with these low cost processes. Extension of these measurements using a confocal microscope demonstrates their viability for the nondestructive quantitative chemical profiling of the layers. Correlation of these data with Raman spectra measured with the same experimental setup allows deepening in the interpretation of the spectra, giving additional information related to the microcrystalline quality of the layers and the presence of secondary phases.

KW - Confocal microscopy

KW - Cu(In,Ga)Se

KW - Photoluminescence

KW - Process monitoring

KW - Raman scattering

KW - Thin film cells

UR - http://www.scopus.com/inward/record.url?scp=84896804867&partnerID=8YFLogxK

U2 - 10.1016/j.solener.2014.02.005

DO - 10.1016/j.solener.2014.02.005

M3 - Article

AN - SCOPUS:84896804867

SN - 0038-092X

VL - 103

SP - 89

EP - 95

JO - Solar Energy

JF - Solar Energy

ER -

Combined Raman scattering/photoluminescence analysis of Cu(In,Ga)Se₂ electrodeposited layers

Abstract

Keywords

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