TY - GEN
T1 - Drift invariant gas recognition technique for on chip Tin oxide gas sensor array
AU - Flitti, F.
AU - Far, A.
AU - Guo, B.
AU - Bermak, A.
PY - 2008
Y1 - 2008
N2 - The purpose of this paper is the study of the robustness of a new low complexity recognition method based on the measurement issued from an on chip 4 × 4 Tin oxide gas sensor array. The recognition system is based on a vector angle similarity measure between the query gas and the representatives of the different gas classes. The latter are obtained using a clustering algorithm based on the same measure within the training data set. Experimented results show more than 98% of good recognition and the robustness of the proposed approach is tested by recognizing gas measurements with simulated drift. Less than 1% of performance degradation is noted at the worst case.
AB - The purpose of this paper is the study of the robustness of a new low complexity recognition method based on the measurement issued from an on chip 4 × 4 Tin oxide gas sensor array. The recognition system is based on a vector angle similarity measure between the query gas and the representatives of the different gas classes. The latter are obtained using a clustering algorithm based on the same measure within the training data set. Experimented results show more than 98% of good recognition and the robustness of the proposed approach is tested by recognizing gas measurements with simulated drift. Less than 1% of performance degradation is noted at the worst case.
UR - http://www.scopus.com/inward/record.url?scp=50649098868&partnerID=8YFLogxK
U2 - 10.1109/DELTA.2008.24
DO - 10.1109/DELTA.2008.24
M3 - Conference contribution
AN - SCOPUS:50649098868
SN - 0769531105
SN - 9780769531106
T3 - Proceedings - 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008
SP - 421
EP - 424
BT - Proceedings - 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008
T2 - 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008
Y2 - 23 January 2008 through 25 January 2008
ER -