Edge Computing Based Early Yellow Rust Disease Detection in Wheat Plants

Ali Ahsan, Muhammad Sajid Iqbal, Muzammil Ahmar, Muhammad Adnan, Muhammad Ali Akbar, Amine Bermak

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The agriculture industry contributes most to expanding economies and populations and is essential to the production of high-quality food. Plant diseases are dependent on a variety of environmental variables that can significantly impact the production gains. Manual approaches for identification are laborious and prone-to-error. The advent of computer vision along with the growing trend of cloud computing, have opened the door for deep learning-based plant disease diagnostics. However, a reliable and fast internet connection is required to use cloud computing which is not feasible in most developing countries. In this work, we have suggested a method for detecting wheat crop yellow rust disease using edge computing. Jetson Nano is used to create typical benchmark deep learning models, including ResNet-18, ResNet-50, RegNet_x_3f_2gf, EfficientNet-B2, MobileNet V3, and DenseNet-101. The yellow rust dataset is used to track the training times and detection accuracies of these models. Based on the testing results, the top-performing networks are ResNet-18 and DenseNet-101. Out of the six models under evaluation, they had the least loss of less than 0.30 with the accuracy of 87%. In comparison to other deep learning models, Resnet-18 needed the least amount of training and testing time, making it the best model for edge computing.

Original languageEnglish
Title of host publication2024 International Conference on Microelectronics, ICM 2024
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350379396
DOIs
Publication statusPublished - 2024
Externally publishedYes
Event2024 International Conference on Microelectronics, ICM 2024 - Doha, Qatar
Duration: 14 Dec 202417 Dec 2024

Publication series

NameProceedings of the International Conference on Microelectronics, ICM
ISSN (Print)2332-7014

Conference

Conference2024 International Conference on Microelectronics, ICM 2024
Country/TerritoryQatar
CityDoha
Period14/12/2417/12/24

Keywords

  • Deep learning
  • Edge Computing
  • MobileNet V3
  • ResNet-18
  • Yellow Rust

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