TY - JOUR
T1 - Enhanced perovskite solar cells performance with TiOx and SnOx thin films as electron transport layers
AU - Hossain, Mohammad Istiaque
AU - Chelvanathan, Puvaneswaran
AU - Aissa, Brahim
AU - Khandakar, Amith
AU - Rahman, Ahasanur
AU - Mansour, Said
N1 - Publisher Copyright:
© The Author(s) 2024.
PY - 2025/3/5
Y1 - 2025/3/5
N2 - We report on the potential application of crystalline thin metal oxide films (TiOx, SnOx) with varying stoichiometries in perovskite solar cell devices. The oxides were deposited via reactive e-beam evaporation, involving the sublimation of pure metals under different pressures of pure oxygen, followed by thermal annealing at 200 degrees C. Variable angle spectroscopic ellipsometry, X-ray diffraction (XRD), contact angle measurements, scanning electron microscopy (SEM), and energy-dispersive X-ray spectroscopy (EDS) were used to characterize the films. XRD findings confirmed the crystalline phases of SnOx thin films treated at 200 degrees C for the most oxygen-rich films (deposited at 2e-4 Torr), while TiOx layers exhibited an amorphous phase. FESEM results confirmed that uniform and dense films were generated across the entire substrate surface. Using the measured refractive indices in a computational model, it was demonstrated that optimizing the device design with these films could result in power conversion efficiencies surpassing 25%.
AB - We report on the potential application of crystalline thin metal oxide films (TiOx, SnOx) with varying stoichiometries in perovskite solar cell devices. The oxides were deposited via reactive e-beam evaporation, involving the sublimation of pure metals under different pressures of pure oxygen, followed by thermal annealing at 200 degrees C. Variable angle spectroscopic ellipsometry, X-ray diffraction (XRD), contact angle measurements, scanning electron microscopy (SEM), and energy-dispersive X-ray spectroscopy (EDS) were used to characterize the films. XRD findings confirmed the crystalline phases of SnOx thin films treated at 200 degrees C for the most oxygen-rich films (deposited at 2e-4 Torr), while TiOx layers exhibited an amorphous phase. FESEM results confirmed that uniform and dense films were generated across the entire substrate surface. Using the measured refractive indices in a computational model, it was demonstrated that optimizing the device design with these films could result in power conversion efficiencies surpassing 25%.
KW - E-beam evaporation
KW - Energy conversion devices
KW - Metal-oxide
KW - SCAPS-1D simulation.
KW - SnOx
KW - Thin films
KW - TiOx
UR - http://www.scopus.com/inward/record.url?scp=86000040074&partnerID=8YFLogxK
U2 - 10.1038/s41598-024-83600-3
DO - 10.1038/s41598-024-83600-3
M3 - Article
AN - SCOPUS:86000040074
SN - 2045-2322
VL - 15
JO - Scientific Reports
JF - Scientific Reports
IS - 1
M1 - 7709
ER -