TY - GEN
T1 - Frequent pattern-based outlier detection measurements
T2 - 2011 International Conference on Research and Innovation in Information Systems, ICRIIS'11
AU - Said, Aiman Moyaid
AU - Dominic, Dhanapal Durai
AU - Samir, Brahim Belhaouari
PY - 2011
Y1 - 2011
N2 - Outlier detection is one of the main data mining tasks. The outliers in data are more significant and interesting than common ones in a wide variety of application domains. Recently, a new trend for detecting the outlier by discovering frequent patterns (or frequent itemsets) from the data set has been studies. In this paper, we present a summarization study of the available outlier detection measurements which are based on the frequent patterns discovery.
AB - Outlier detection is one of the main data mining tasks. The outliers in data are more significant and interesting than common ones in a wide variety of application domains. Recently, a new trend for detecting the outlier by discovering frequent patterns (or frequent itemsets) from the data set has been studies. In this paper, we present a summarization study of the available outlier detection measurements which are based on the frequent patterns discovery.
KW - frequent pattern mining
KW - outlier detection
KW - outlier measurement
UR - http://www.scopus.com/inward/record.url?scp=84856347462&partnerID=8YFLogxK
U2 - 10.1109/ICRIIS.2011.6125705
DO - 10.1109/ICRIIS.2011.6125705
M3 - Conference contribution
AN - SCOPUS:84856347462
SN - 9781612842950
T3 - 2011 International Conference on Research and Innovation in Information Systems, ICRIIS'11
BT - 2011 International Conference on Research and Innovation in Information Systems, ICRIIS'11
Y2 - 23 November 2011 through 24 November 2011
ER -