TY - GEN
T1 - Impact of Dimensionality Reduction Techniques on the Classification of Ceramic Insulators Defects
AU - Darwish, Ahmad
AU - El-Hag, Ayman H.
AU - Refaat, Shady S.
AU - Abu-Rub, Haitham
AU - Toliyat, Hamid A.
N1 - Publisher Copyright:
© 2021 IEEE.
PY - 2021
Y1 - 2021
N2 - Ultra-high frequency (UHF) based testing of disc ceramic insulators has been predominantly used for the detection and classification of partial discharge (PD) defects. The initiated electromagnetic waves due to PD currents can be captured using UHF antennas. In this paper, three classes of ceramic insulator defects namely corona discharge, cracks on insulator, and voids are classified using machine learning (ML) techniques. The classification accuracies are presented with and without the use of two dimensionality reduction techniques, i.e. principal component analysis (PCA) and recursive feature elimination (RFE). A total of 322 signals were obtained from laboratory tests using a wideband Horn antenna. Then, wavelet decomposition was applied to the obtained signals, and some statistical features, which were fed to the ML algorithms, were obtained at each decomposition level. Four score metrics are used for the classification, namely accuracy, precision, recall, and f1-score. Recall (sensitivity) and f1-score are important metrics when dealing with imbalanced data. It has been shown that although PCA is very efficient in reducing the number of input features, it reduces the classification score metrics. This is attributed to the loss of important information associated with the use of PCA. On the other hand, RFE does not have a large impact on the different score metrics.
AB - Ultra-high frequency (UHF) based testing of disc ceramic insulators has been predominantly used for the detection and classification of partial discharge (PD) defects. The initiated electromagnetic waves due to PD currents can be captured using UHF antennas. In this paper, three classes of ceramic insulator defects namely corona discharge, cracks on insulator, and voids are classified using machine learning (ML) techniques. The classification accuracies are presented with and without the use of two dimensionality reduction techniques, i.e. principal component analysis (PCA) and recursive feature elimination (RFE). A total of 322 signals were obtained from laboratory tests using a wideband Horn antenna. Then, wavelet decomposition was applied to the obtained signals, and some statistical features, which were fed to the ML algorithms, were obtained at each decomposition level. Four score metrics are used for the classification, namely accuracy, precision, recall, and f1-score. Recall (sensitivity) and f1-score are important metrics when dealing with imbalanced data. It has been shown that although PCA is very efficient in reducing the number of input features, it reduces the classification score metrics. This is attributed to the loss of important information associated with the use of PCA. On the other hand, RFE does not have a large impact on the different score metrics.
UR - http://www.scopus.com/inward/record.url?scp=85126007451&partnerID=8YFLogxK
U2 - 10.1109/CEIDP50766.2021.9705364
DO - 10.1109/CEIDP50766.2021.9705364
M3 - Conference contribution
AN - SCOPUS:85126007451
T3 - Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
SP - 243
EP - 246
BT - 96th IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2021 - co-located with 16th IEEE Nanotechnology Materials and Devices Conference, NMDC 2021
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 96th IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2021
Y2 - 12 December 2021 through 15 December 2021
ER -