TY - JOUR
T1 - Microstructure degradation of LSM/YSZ cathodes for solid oxide fuel cells aged in stack after long operation time
AU - Zekri, Atef
AU - Schnetger, Bernhard
AU - Essafi, Mohamed Amine
AU - Plaggenborg, Thorsten
AU - Parisi, Jürgen
AU - Knipper, Martin
N1 - Publisher Copyright:
© 2017 The Electrochemical Society. All rights reserved.
PY - 2017
Y1 - 2017
N2 - The performance of solid oxide fuel cells (SOFCs) as well as their lifetime are strongly dependent on electrode microstructure. In this paper the effects of long exposure time (up to 20 000 h) under realistic operation conditions (T = 850°C, J = 190–250 mA·cm−2) in the microstructural degradation are investigated for porous Lanthanum Strontium Manganite (LSM)/Yttria-Stabilized Zirconia (YSZ) cathodes in order to understand the microstructural evolution in SOFC cermet cathodes. Data acquired from high resolution and optimized 3D imaging technique Focused Ion Beam (FIB)/Scanning Electron Microscope (SEM) was used in the quantification of various cathode structures aged during different operating times (2 500 h, 15 000 h and 20 000 h). The methodologies of tomography enable a precise quantification of particle grain growth, connectivity, tortuosity factor and triple phase boundary length (TPBL). Statistically no significant 3D microstructural changes were observed in the cathode by increasing the operating time. The quantitative results from the FIB/SEM tomography were combined with additional semi quantitative measurements done by X-ray fluorescence (XRF) in order to study the chrome poisoning in the cathodes. Both techniques led to a more thorough description of the degradation phenomena in the microstructures of LSM-based cathodes.
AB - The performance of solid oxide fuel cells (SOFCs) as well as their lifetime are strongly dependent on electrode microstructure. In this paper the effects of long exposure time (up to 20 000 h) under realistic operation conditions (T = 850°C, J = 190–250 mA·cm−2) in the microstructural degradation are investigated for porous Lanthanum Strontium Manganite (LSM)/Yttria-Stabilized Zirconia (YSZ) cathodes in order to understand the microstructural evolution in SOFC cermet cathodes. Data acquired from high resolution and optimized 3D imaging technique Focused Ion Beam (FIB)/Scanning Electron Microscope (SEM) was used in the quantification of various cathode structures aged during different operating times (2 500 h, 15 000 h and 20 000 h). The methodologies of tomography enable a precise quantification of particle grain growth, connectivity, tortuosity factor and triple phase boundary length (TPBL). Statistically no significant 3D microstructural changes were observed in the cathode by increasing the operating time. The quantitative results from the FIB/SEM tomography were combined with additional semi quantitative measurements done by X-ray fluorescence (XRF) in order to study the chrome poisoning in the cathodes. Both techniques led to a more thorough description of the degradation phenomena in the microstructures of LSM-based cathodes.
UR - http://www.scopus.com/inward/record.url?scp=85033704893&partnerID=8YFLogxK
U2 - 10.1149/2.0581713jes
DO - 10.1149/2.0581713jes
M3 - Article
AN - SCOPUS:85033704893
SN - 0013-4651
VL - 164
SP - F1385-F1391
JO - Journal of the Electrochemical Society
JF - Journal of the Electrochemical Society
IS - 13
ER -