Multiscale ARX process modeling

Mohamed N. Nounou*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Citations (Scopus)

Abstract

Multiscale wavelet-based representation of data has been shown to be a powerful tool in feature extraction from practical process data. In this paper, this characteristic of multiscale representation is utilized to improve the prediction accuracy of the popular linear auto-regressive with exogenous variable (ARX) model by developing a multiscale ARX (MSARX) modeling algorithm. The idea is to decompose the input-output data, construct multiple ARX models at multiple scales using the scaled signal approximations of the data, and then using cross validation, select among all MSARX models the one which best describes the process. Also, the MSARX modeling algorithm is shown to improve the parsimony of the estimated models, as ARX models with a fewer number of coefficients are needed at coarser scales. This advantage is attributed to the down-sampling used in multiscale decomposition of data. The main advantage of the MSARX algorithm is that it inherently accounts for the presence of noise in the data by the application of low pass filters used in the decomposition of the input-output data, which in turn improves the model robustness to measurement noise in the data and thus enhances its prediction. These prediction and parsimony advantages of the developed MSARX modeling algorithm are demonstrated using a simulated second order process.

Original languageEnglish
Title of host publicationProceedings of the 45th IEEE Conference on Decision and Control 2006, CDC
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages823-828
Number of pages6
ISBN (Print)1424401712, 9781424401710
DOIs
Publication statusPublished - 2006
Externally publishedYes
Event45th IEEE Conference on Decision and Control 2006, CDC - San Diego, CA, United States
Duration: 13 Dec 200615 Dec 2006

Publication series

NameProceedings of the IEEE Conference on Decision and Control
ISSN (Print)0743-1546
ISSN (Electronic)2576-2370

Conference

Conference45th IEEE Conference on Decision and Control 2006, CDC
Country/TerritoryUnited States
CitySan Diego, CA
Period13/12/0615/12/06

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