NDE of additively manufactured parts via directly bonded and mechanically attached electromechanical impedance sensors

C. Tenney*, M. Albakri, C. B. Williams, P. Tarazaga

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

8 Citations (Scopus)

Abstract

Additive Manufacturing (AM) allows increased complexity which poses challenges to quality-control (QC) and non-destructive evaluation (NDE) of manufactured parts. The lack of simple, reliable, and inexpensive methods for NDE of AM parts is a significant obstacle to wider adoption of AM parts. Electromechanical impedance measurements have been investigated as a means to detect manufacturing defects in AM parts. Impedance-based NDE utilizes piezoelectric wafers as collocated sensors and actuators. Taking advantage of the coupled electromechanical characteristics of piezoelectric materials, the mechanical characteristics of the part under test can be inferred from the electrical impedance of the piezoelectric wafer. Previous efforts have used piezoelectric wafers bonded directly to the part under test, which imposes several challenges regarding the applicability and robustness of the technique. This paper investigates the use of an instrumented clamp as a solution for measuring the electromechanical impedance of the part under test. The effectiveness of this approach in detecting manufacturing defects is compared to directly bonded wafers.

Original languageEnglish
Title of host publicationDynamics of Civil Structures, Volume 2 - Proceedings of the 36th IMAC, A Conference and Exposition on Structural Dynamics 2018
EditorsShamim Pakzad
PublisherSpringer Science and Business Media, LLC
Pages263-271
Number of pages9
ISBN (Print)9783319744209
DOIs
Publication statusPublished - 2019
Externally publishedYes
EventSEM Annual Conference and Exposition on Experimental and Applied Mechanics, 2018 - Greenville, United States
Duration: 4 Jun 20187 Jun 2018

Publication series

NameConference Proceedings of the Society for Experimental Mechanics Series
ISSN (Print)2191-5644
ISSN (Electronic)2191-5652

Conference

ConferenceSEM Annual Conference and Exposition on Experimental and Applied Mechanics, 2018
Country/TerritoryUnited States
CityGreenville
Period4/06/187/06/18

Keywords

  • Additive manufacturing
  • Electromechanical impedance
  • Manufacturing defects
  • Non-destructive evaluation
  • Piezoelectrics

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