Raman scattering microcrystalline assessment and device quality control of electrodeposited CuIn(S,Se)2 based solar cells

V. Izquierdo; A. Pérez-Rodríguez; L. Calvo-Barrio; J. Álvarez-García; J. R. Morante; V. Bermudez; O. Ramdani; J. Kurdi; P. P. Grand; L. Parissi; O. Kerrec

doi:10.1016/j.tsf.2007.12.068

Raman scattering microcrystalline assessment and device quality control of electrodeposited CuIn(S,Se)₂ based solar cells

V. Izquierdo, A. Pérez-Rodríguez^*, L. Calvo-Barrio, J. Álvarez-García, J. R. Morante, V. Bermudez, O. Ramdani, J. Kurdi, P. P. Grand, L. Parissi, O. Kerrec

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

14 Citations (Scopus)

Abstract

The Raman scattering analysis of S-rich CuIn(S,Se)₂ layers produced by electrodeposition of CuInSe₂ precursors and annealing under sulphurising conditions shows the strong dependence of their crystalline quality on the annealing parameters. Worsening of the crystalline quality is reflected by the presence of an increasing contribution at the higher frequency side of the main Raman band. The comparison of these data with the solar cell parameters points out the existence of a correlation between the efficiency of the devices and the width of the mode. The dependence of the Raman spectra on differences in the process parameters with significant impact in the microcrystalline quality of the layers give interest to the use of Raman scattering as process assessment technique for device quality control.

Original language	English
Pages (from-to)	7021-7025
Number of pages	5
Journal	Thin Solid Films
Volume	516
Issue number	20
DOIs	https://doi.org/10.1016/j.tsf.2007.12.068
Publication status	Published - 30 Aug 2008
Externally published	Yes

Keywords

Chalcopyrites
CuIn(S,Se)
Raman scattering
Solar cells

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10.1016/j.tsf.2007.12.068

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Izquierdo, V., Pérez-Rodríguez, A., Calvo-Barrio, L., Álvarez-García, J., Morante, J. R., Bermudez, V., Ramdani, O., Kurdi, J., Grand, P. P., Parissi, L., & Kerrec, O. (2008). Raman scattering microcrystalline assessment and device quality control of electrodeposited CuIn(S,Se)₂ based solar cells. Thin Solid Films, 516(20), 7021-7025. https://doi.org/10.1016/j.tsf.2007.12.068

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title = "Raman scattering microcrystalline assessment and device quality control of electrodeposited CuIn(S,Se)2 based solar cells",

abstract = "The Raman scattering analysis of S-rich CuIn(S,Se)2 layers produced by electrodeposition of CuInSe2 precursors and annealing under sulphurising conditions shows the strong dependence of their crystalline quality on the annealing parameters. Worsening of the crystalline quality is reflected by the presence of an increasing contribution at the higher frequency side of the main Raman band. The comparison of these data with the solar cell parameters points out the existence of a correlation between the efficiency of the devices and the width of the mode. The dependence of the Raman spectra on differences in the process parameters with significant impact in the microcrystalline quality of the layers give interest to the use of Raman scattering as process assessment technique for device quality control.",

keywords = "Chalcopyrites, CuIn(S,Se), Raman scattering, Solar cells",

author = "V. Izquierdo and A. P{\'e}rez-Rodr{\'i}guez and L. Calvo-Barrio and J. {\'A}lvarez-Garc{\'i}a and Morante, {J. R.} and V. Bermudez and O. Ramdani and J. Kurdi and Grand, {P. P.} and L. Parissi and O. Kerrec",

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doi = "10.1016/j.tsf.2007.12.068",

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Izquierdo, V, Pérez-Rodríguez, A, Calvo-Barrio, L, Álvarez-García, J, Morante, JR, Bermudez, V, Ramdani, O, Kurdi, J, Grand, PP, Parissi, L & Kerrec, O 2008, 'Raman scattering microcrystalline assessment and device quality control of electrodeposited CuIn(S,Se)₂ based solar cells', Thin Solid Films, vol. 516, no. 20, pp. 7021-7025. https://doi.org/10.1016/j.tsf.2007.12.068

TY - JOUR

T1 - Raman scattering microcrystalline assessment and device quality control of electrodeposited CuIn(S,Se)2 based solar cells

AU - Izquierdo, V.

AU - Pérez-Rodríguez, A.

AU - Calvo-Barrio, L.

AU - Álvarez-García, J.

AU - Morante, J. R.

AU - Bermudez, V.

AU - Ramdani, O.

AU - Kurdi, J.

AU - Grand, P. P.

AU - Parissi, L.

AU - Kerrec, O.

PY - 2008/8/30

Y1 - 2008/8/30

N2 - The Raman scattering analysis of S-rich CuIn(S,Se)2 layers produced by electrodeposition of CuInSe2 precursors and annealing under sulphurising conditions shows the strong dependence of their crystalline quality on the annealing parameters. Worsening of the crystalline quality is reflected by the presence of an increasing contribution at the higher frequency side of the main Raman band. The comparison of these data with the solar cell parameters points out the existence of a correlation between the efficiency of the devices and the width of the mode. The dependence of the Raman spectra on differences in the process parameters with significant impact in the microcrystalline quality of the layers give interest to the use of Raman scattering as process assessment technique for device quality control.

AB - The Raman scattering analysis of S-rich CuIn(S,Se)2 layers produced by electrodeposition of CuInSe2 precursors and annealing under sulphurising conditions shows the strong dependence of their crystalline quality on the annealing parameters. Worsening of the crystalline quality is reflected by the presence of an increasing contribution at the higher frequency side of the main Raman band. The comparison of these data with the solar cell parameters points out the existence of a correlation between the efficiency of the devices and the width of the mode. The dependence of the Raman spectra on differences in the process parameters with significant impact in the microcrystalline quality of the layers give interest to the use of Raman scattering as process assessment technique for device quality control.

KW - Chalcopyrites

KW - CuIn(S,Se)

KW - Raman scattering

KW - Solar cells

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U2 - 10.1016/j.tsf.2007.12.068

DO - 10.1016/j.tsf.2007.12.068

M3 - Article

AN - SCOPUS:45949105887

SN - 0040-6090

VL - 516

SP - 7021

EP - 7025

JO - Thin Solid Films

JF - Thin Solid Films

IS - 20

ER -

Raman scattering microcrystalline assessment and device quality control of electrodeposited CuIn(S,Se)₂ based solar cells

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