TY - GEN
T1 - Read-out circuit analysis for high-speed low-noise VCO based APS CMOS image sensor
AU - Tang, Fang
AU - Bermak, Amine
PY - 2010
Y1 - 2010
N2 - A detailed read-out circuit analysis of the VCO based APS CMOS image sensor is presented in this paper. According to the mathematic analysis and simulation results, the read-out speed should be decreased when reducing the bias current. Moreover, the feature of the device gain factor and the source follower's threshold voltage are investigated, showing important effects with respect to not only the read-out time but also the energy consumption. The proposed VCO based read-out circuit and frequency counter consist an equivalent bandpass filter. According to the transfer function analysis of this equivalent filter, the noise cancellation efficiency is jointly determined by the bias current, device gain factor and source follower's threshold voltage, which constitute the basic principles for high-speed low-noise CMOS APS image sensor design.
AB - A detailed read-out circuit analysis of the VCO based APS CMOS image sensor is presented in this paper. According to the mathematic analysis and simulation results, the read-out speed should be decreased when reducing the bias current. Moreover, the feature of the device gain factor and the source follower's threshold voltage are investigated, showing important effects with respect to not only the read-out time but also the energy consumption. The proposed VCO based read-out circuit and frequency counter consist an equivalent bandpass filter. According to the transfer function analysis of this equivalent filter, the noise cancellation efficiency is jointly determined by the bias current, device gain factor and source follower's threshold voltage, which constitute the basic principles for high-speed low-noise CMOS APS image sensor design.
KW - APS imager
KW - CMOS image sensor
KW - High speed
KW - Low noise
UR - http://www.scopus.com/inward/record.url?scp=77952395669&partnerID=8YFLogxK
U2 - 10.1109/DELTA.2010.11
DO - 10.1109/DELTA.2010.11
M3 - Conference contribution
AN - SCOPUS:77952395669
SN - 9780769539782
T3 - Proceedings - 5th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2010
SP - 330
EP - 335
BT - Proceedings - 5th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2010
T2 - 5th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2010
Y2 - 13 January 2010 through 15 January 2010
ER -