TY - JOUR
T1 - Reduced Kernel Random Forest Technique for Fault Detection and Classification in Grid-Tied PV Systems
AU - Dhibi, Khaled
AU - Fezai, Radhia
AU - Mansouri, Majdi
AU - Trabelsi, Mohamed
AU - Kouadri, Abdelmalek
AU - Bouzara, Kais
AU - Nounou, Hazem
AU - Nounou, Mohamed
N1 - Publisher Copyright:
© 2011-2012 IEEE.
PY - 2020/11
Y1 - 2020/11
N2 - The random forest (RF) classifier, which is a combination of tree predictors, is one of the most powerful classification algorithms that has been recently applied for fault detection and diagnosis (FDD) of industrial processes. However, RF is still suffering from some limitations such as the noncorrelation between variables. These limitations are due to the direct use of variables measured at nodes and therefore the only use of static information from the process data. Thus, this article proposes two enhanced RF classifiers, namely the Euclidean distance based reduced kernel RF (RK-RF$_{\text{ED}}$) and K-means clustering based reduced kernel RF (RK-RF$_{\text{Kmeans}}$), for FDD. Based on the kernel principal component analysis, the proposed classifiers consist of two main stages: feature extraction and selection, and fault classification. In the first stage, the number of observations in the training data set is reduced using two methods: the first method consists of using the Euclidean distance as dissimilarity metric so that only one measurement is kept in case of redundancy between samples. The second method aims at reducing the amount of the training data based on the K-means clustering technique. Once the characteristics of the process are extracted, the most sensitive features are selected. During the second phase, the selected features are fed to an RF classifier. An emulated grid-connected PV system is used to validate the performance of the proposed RK-RF$_{\text{ED}}$ and RK-RF$_{\text{Kmeans}}$ classifiers. The presented results confirm the high classification accuracy of the developed techniques with low computation time.
AB - The random forest (RF) classifier, which is a combination of tree predictors, is one of the most powerful classification algorithms that has been recently applied for fault detection and diagnosis (FDD) of industrial processes. However, RF is still suffering from some limitations such as the noncorrelation between variables. These limitations are due to the direct use of variables measured at nodes and therefore the only use of static information from the process data. Thus, this article proposes two enhanced RF classifiers, namely the Euclidean distance based reduced kernel RF (RK-RF$_{\text{ED}}$) and K-means clustering based reduced kernel RF (RK-RF$_{\text{Kmeans}}$), for FDD. Based on the kernel principal component analysis, the proposed classifiers consist of two main stages: feature extraction and selection, and fault classification. In the first stage, the number of observations in the training data set is reduced using two methods: the first method consists of using the Euclidean distance as dissimilarity metric so that only one measurement is kept in case of redundancy between samples. The second method aims at reducing the amount of the training data based on the K-means clustering technique. Once the characteristics of the process are extracted, the most sensitive features are selected. During the second phase, the selected features are fed to an RF classifier. An emulated grid-connected PV system is used to validate the performance of the proposed RK-RF$_{\text{ED}}$ and RK-RF$_{\text{Kmeans}}$ classifiers. The presented results confirm the high classification accuracy of the developed techniques with low computation time.
KW - Fault classification
KW - fault diagnosis
KW - feature extraction
KW - grid-connected PV system
KW - kernel principal component analysis (K-PCA)
KW - machine learning
KW - random forest
KW - reduced K-PCA
UR - http://www.scopus.com/inward/record.url?scp=85094842203&partnerID=8YFLogxK
U2 - 10.1109/JPHOTOV.2020.3011068
DO - 10.1109/JPHOTOV.2020.3011068
M3 - Article
AN - SCOPUS:85094842203
SN - 2156-3381
VL - 10
SP - 1864
EP - 1871
JO - IEEE Journal of Photovoltaics
JF - IEEE Journal of Photovoltaics
IS - 6
M1 - 9158007
ER -