TY - GEN
T1 - Spectral element based optimization scheme for damage identification
AU - Albakri, M. I.
AU - Tarazaga, P. A.
N1 - Publisher Copyright:
© The Society for Experimental Mechanics, Inc. 2014.
PY - 2014
Y1 - 2014
N2 - Due to its simplicity, impedance-based structural health monitoring (SHM) has gained a lot of interest in the SHM community. Impedance measurements have proved to be very effective in detecting the presence of damage. Damage identification, on the other hand, can hardly be done with a single impedance measurement, and an array of sensors is normally required to identify damage location and severity. However, impedance measurements contain valuable information about the fundamental frequencies of the structure, and when combined with modelling, more quantitative information on structural damages can be extracted. In this study, a single impedance measurement is used for damage detection and identification in a beam. Spectral element model is developed to calculate the structural impedance of the damaged beam, and then damage defining parameters, which are damage location, width and severity, are updated through an optimization scheme. The proposed technique is computationally efficient, as it requires solving a very small system of equations with only three optimization parameters.
AB - Due to its simplicity, impedance-based structural health monitoring (SHM) has gained a lot of interest in the SHM community. Impedance measurements have proved to be very effective in detecting the presence of damage. Damage identification, on the other hand, can hardly be done with a single impedance measurement, and an array of sensors is normally required to identify damage location and severity. However, impedance measurements contain valuable information about the fundamental frequencies of the structure, and when combined with modelling, more quantitative information on structural damages can be extracted. In this study, a single impedance measurement is used for damage detection and identification in a beam. Spectral element model is developed to calculate the structural impedance of the damaged beam, and then damage defining parameters, which are damage location, width and severity, are updated through an optimization scheme. The proposed technique is computationally efficient, as it requires solving a very small system of equations with only three optimization parameters.
KW - Damage identification
KW - Electromechanical impedance
KW - Optimization
KW - Spectral element method
KW - Structural health monitoring
UR - http://www.scopus.com/inward/record.url?scp=84988728460&partnerID=8YFLogxK
U2 - 10.1007/978-3-319-04570-2_3
DO - 10.1007/978-3-319-04570-2_3
M3 - Conference contribution
AN - SCOPUS:84988728460
SN - 9783319007793
SN - 9783319045696
T3 - Conference Proceedings of the Society for Experimental Mechanics Series
SP - 19
EP - 27
BT - MEMS and Nanotechnology - Proceedings of the 2013 Annual Conference on Experimental and Applied Mechanics
A2 - Wicks, Alfred
PB - Springer New York LLC
T2 - 32nd IMAC Conference and Exposition on Structural Dynamics, 2014
Y2 - 3 February 2014 through 6 February 2014
ER -