Temperature dependent fatigue in ferroelectric PZT thin films

E. N. Paton; S. A. Mansour; A. Bement

Temperature dependent fatigue in ferroelectric PZT thin films

E. N. Paton^*, S. A. Mansour, A. Bement

^*Corresponding author for this work

Purdue University

Research output: Contribution to conference › Paper › peer-review

5 Citations (Scopus)

Abstract

The rate of electrical fatigue at different temperatures was measured for lead zirconate titanate capacitors with the composition Pb(Zr_.60Ti_.40)O₃. Results showed that a temperature rise contributes to an increasing rate of logarithmic decay in the fatigue profile. We distinguish two thermally dependent stages during fatigue; each plotted as separate Arrhenius relationships. The first stage has an experimentally measured activation energy of 0.22 eV while the second stage has a measured value of 0.042 eV. The physical basis for these activation energies has not been identified due to the complexity of interactions occurring during the switching reversals. Even so, the measured values give some indication of the types of defects and the mechanisms responsible in each stage.

Original language	English
Pages	467-470
Number of pages	4
Publication status	Published - 1996
Externally published	Yes
Event	Proceedings of the 1996 10th IEEE International Symposium on Applications of Ferroelectrics, ISAF. Part 1 (of 2) - East Brunswick, NJ, USA Duration: 18 Aug 1996 → 21 Aug 1996

Conference

Conference	Proceedings of the 1996 10th IEEE International Symposium on Applications of Ferroelectrics, ISAF. Part 1 (of 2)
City	East Brunswick, NJ, USA
Period	18/08/96 → 21/08/96

Cite this

@conference{9640446753584a61a8498ebaaa0984bb,

title = "Temperature dependent fatigue in ferroelectric PZT thin films",

abstract = "The rate of electrical fatigue at different temperatures was measured for lead zirconate titanate capacitors with the composition Pb(Zr.60Ti.40)O3. Results showed that a temperature rise contributes to an increasing rate of logarithmic decay in the fatigue profile. We distinguish two thermally dependent stages during fatigue; each plotted as separate Arrhenius relationships. The first stage has an experimentally measured activation energy of 0.22 eV while the second stage has a measured value of 0.042 eV. The physical basis for these activation energies has not been identified due to the complexity of interactions occurring during the switching reversals. Even so, the measured values give some indication of the types of defects and the mechanisms responsible in each stage.",

author = "Paton, {E. N.} and Mansour, {S. A.} and A. Bement",

year = "1996",

language = "English",

pages = "467--470",

note = "Proceedings of the 1996 10th IEEE International Symposium on Applications of Ferroelectrics, ISAF. Part 1 (of 2) ; Conference date: 18-08-1996 Through 21-08-1996",

}

TY - CONF

T1 - Temperature dependent fatigue in ferroelectric PZT thin films

AU - Paton, E. N.

AU - Mansour, S. A.

AU - Bement, A.

PY - 1996

Y1 - 1996

N2 - The rate of electrical fatigue at different temperatures was measured for lead zirconate titanate capacitors with the composition Pb(Zr.60Ti.40)O3. Results showed that a temperature rise contributes to an increasing rate of logarithmic decay in the fatigue profile. We distinguish two thermally dependent stages during fatigue; each plotted as separate Arrhenius relationships. The first stage has an experimentally measured activation energy of 0.22 eV while the second stage has a measured value of 0.042 eV. The physical basis for these activation energies has not been identified due to the complexity of interactions occurring during the switching reversals. Even so, the measured values give some indication of the types of defects and the mechanisms responsible in each stage.

AB - The rate of electrical fatigue at different temperatures was measured for lead zirconate titanate capacitors with the composition Pb(Zr.60Ti.40)O3. Results showed that a temperature rise contributes to an increasing rate of logarithmic decay in the fatigue profile. We distinguish two thermally dependent stages during fatigue; each plotted as separate Arrhenius relationships. The first stage has an experimentally measured activation energy of 0.22 eV while the second stage has a measured value of 0.042 eV. The physical basis for these activation energies has not been identified due to the complexity of interactions occurring during the switching reversals. Even so, the measured values give some indication of the types of defects and the mechanisms responsible in each stage.

UR - http://www.scopus.com/inward/record.url?scp=0030349074&partnerID=8YFLogxK

M3 - Paper

AN - SCOPUS:0030349074

SP - 467

EP - 470

T2 - Proceedings of the 1996 10th IEEE International Symposium on Applications of Ferroelectrics, ISAF. Part 1 (of 2)

Y2 - 18 August 1996 through 21 August 1996

ER -

Temperature dependent fatigue in ferroelectric PZT thin films

Abstract

Conference

Other files and links

Fingerprint

Cite this