Thermoreflectance imaging of laser diodes and VCSELs along and perpendicular to the emission direction

M. Bardoux; A. Bousseksou; G. Tessier; S. Bouchoule; D. Fournier; A. Salhi; Y. Rouillard; F. Genty

doi:10.1016/j.optlaseng.2008.07.011

Thermoreflectance imaging of laser diodes and VCSELs along and perpendicular to the emission direction

M. Bardoux^*, A. Bousseksou, G. Tessier, S. Bouchoule, D. Fournier, A. Salhi, Y. Rouillard, F. Genty

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

4 Citations (Scopus)

Abstract

Thermal characterization of semiconductor lasers is an important issue for optoelectronics. This paper presents our thermoreflectance measurements on two different types of laser diodes: classical ridge laser diodes and vertical cavity surface emitting lasers (VCSELs). We first studied the external temperature increase in ridge diodes in order to determine inhomogeneity. Then, we tried to determine the inner temperature of the VCSELs.

Original language	English
Pages (from-to)	473-476
Number of pages	4
Journal	Optics and Lasers in Engineering
Volume	47
Issue number	3-4
DOIs	https://doi.org/10.1016/j.optlaseng.2008.07.011
Publication status	Published - Mar 2009
Externally published	Yes

Keywords

Laser diodes
Thermal imaging
Thermoreflectance
VCSEL

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10.1016/j.optlaseng.2008.07.011

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title = "Thermoreflectance imaging of laser diodes and VCSELs along and perpendicular to the emission direction",

abstract = "Thermal characterization of semiconductor lasers is an important issue for optoelectronics. This paper presents our thermoreflectance measurements on two different types of laser diodes: classical ridge laser diodes and vertical cavity surface emitting lasers (VCSELs). We first studied the external temperature increase in ridge diodes in order to determine inhomogeneity. Then, we tried to determine the inner temperature of the VCSELs.",

keywords = "Laser diodes, Thermal imaging, Thermoreflectance, VCSEL",

author = "M. Bardoux and A. Bousseksou and G. Tessier and S. Bouchoule and D. Fournier and A. Salhi and Y. Rouillard and F. Genty",

year = "2009",

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language = "English",

volume = "47",

pages = "473--476",

journal = "Optics and Lasers in Engineering",

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TY - JOUR

T1 - Thermoreflectance imaging of laser diodes and VCSELs along and perpendicular to the emission direction

AU - Bardoux, M.

AU - Bousseksou, A.

AU - Tessier, G.

AU - Bouchoule, S.

AU - Fournier, D.

AU - Salhi, A.

AU - Rouillard, Y.

AU - Genty, F.

PY - 2009/3

Y1 - 2009/3

N2 - Thermal characterization of semiconductor lasers is an important issue for optoelectronics. This paper presents our thermoreflectance measurements on two different types of laser diodes: classical ridge laser diodes and vertical cavity surface emitting lasers (VCSELs). We first studied the external temperature increase in ridge diodes in order to determine inhomogeneity. Then, we tried to determine the inner temperature of the VCSELs.

AB - Thermal characterization of semiconductor lasers is an important issue for optoelectronics. This paper presents our thermoreflectance measurements on two different types of laser diodes: classical ridge laser diodes and vertical cavity surface emitting lasers (VCSELs). We first studied the external temperature increase in ridge diodes in order to determine inhomogeneity. Then, we tried to determine the inner temperature of the VCSELs.

KW - Laser diodes

KW - Thermal imaging

KW - Thermoreflectance

KW - VCSEL

UR - http://www.scopus.com/inward/record.url?scp=59549106092&partnerID=8YFLogxK

U2 - 10.1016/j.optlaseng.2008.07.011

DO - 10.1016/j.optlaseng.2008.07.011

M3 - Article

AN - SCOPUS:59549106092

SN - 0143-8166

VL - 47

SP - 473

EP - 476

JO - Optics and Lasers in Engineering

JF - Optics and Lasers in Engineering

IS - 3-4

ER -

Thermoreflectance imaging of laser diodes and VCSELs along and perpendicular to the emission direction

Abstract

Keywords

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