UV-Raman scattering assessment of ZnO:Al layers from Cu(In, Ga)Se 2 based solar cells: Application for fast on-line process monitoring

Cristina Insignares-Cuello; Victor Izquierdo-Roca; Xavier Fontane; Yudenia Sanchez; Juan Lopez-Garcia; Cedric Broussillou; Edgardo Saucedo; Veronica Bermudez; Alejandro Perez-Rodriguez

doi:10.1109/PVSC.2013.6744410

UV-Raman scattering assessment of ZnO:Al layers from Cu(In, Ga)Se ₂ based solar cells: Application for fast on-line process monitoring

Cristina Insignares-Cuello, Victor Izquierdo-Roca, Xavier Fontane, Yudenia Sanchez, Juan Lopez-Garcia, Cedric Broussillou, Edgardo Saucedo, Veronica Bermudez, Alejandro Perez-Rodriguez

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

In this paper, we present a non destructive optical methodology based on the use of pre-resonant UV-Raman scattering measurements, which allows for the on-line fast characterization of ZnO:Al (AZO) transparent conductive oxide (TCO). The experimental data corroborate the possibility to obtain by this methodology reliable information about the electrical properties of the TCO layers. The UV-Raman spectra of AZO are characterized by the presence of a defect-induced band. The relative intensity of this band in the spectra shows a clear correlation with the TCO resistivity. This methodology has been tested in real case devices, showing its potential for its implementation as on-line control tool for TCO's in the photovoltaic industry.

Original language	English
Title of host publication	39th IEEE Photovoltaic Specialists Conference, PVSC 2013
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	1423-1426
Number of pages	4
ISBN (Print)	9781479932993
DOIs	https://doi.org/10.1109/PVSC.2013.6744410
Publication status	Published - 2013
Externally published	Yes
Event	39th IEEE Photovoltaic Specialists Conference, PVSC 2013 - Tampa, FL, United States Duration: 16 Jun 2013 → 21 Jun 2013

Publication series

Name	Conference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)	0160-8371

Conference

Conference	39th IEEE Photovoltaic Specialists Conference, PVSC 2013
Country/Territory	United States
City	Tampa, FL
Period	16/06/13 → 21/06/13

Keywords

Electric resistance
Photovoltaic cells
Raman scattering
Sputtering
Thin film devices

Access to Document

10.1109/PVSC.2013.6744410

Cite this

Insignares-Cuello, C., Izquierdo-Roca, V., Fontane, X., Sanchez, Y., Lopez-Garcia, J., Broussillou, C., Saucedo, E., Bermudez, V., & Perez-Rodriguez, A. (2013). UV-Raman scattering assessment of ZnO:Al layers from Cu(In, Ga)Se ₂ based solar cells: Application for fast on-line process monitoring. In 39th IEEE Photovoltaic Specialists Conference, PVSC 2013 (pp. 1423-1426). Article 6744410 (Conference Record of the IEEE Photovoltaic Specialists Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2013.6744410

Insignares-Cuello, Cristina ; Izquierdo-Roca, Victor ; Fontane, Xavier et al. / UV-Raman scattering assessment of ZnO:Al layers from Cu(In, Ga)Se ₂ based solar cells : Application for fast on-line process monitoring. 39th IEEE Photovoltaic Specialists Conference, PVSC 2013. Institute of Electrical and Electronics Engineers Inc., 2013. pp. 1423-1426 (Conference Record of the IEEE Photovoltaic Specialists Conference).

@inproceedings{5a997b0d6bf8446cbb860e5879986f8c,

title = "UV-Raman scattering assessment of ZnO:Al layers from Cu(In, Ga)Se 2 based solar cells: Application for fast on-line process monitoring",

abstract = "In this paper, we present a non destructive optical methodology based on the use of pre-resonant UV-Raman scattering measurements, which allows for the on-line fast characterization of ZnO:Al (AZO) transparent conductive oxide (TCO). The experimental data corroborate the possibility to obtain by this methodology reliable information about the electrical properties of the TCO layers. The UV-Raman spectra of AZO are characterized by the presence of a defect-induced band. The relative intensity of this band in the spectra shows a clear correlation with the TCO resistivity. This methodology has been tested in real case devices, showing its potential for its implementation as on-line control tool for TCO's in the photovoltaic industry.",

keywords = "Electric resistance, Photovoltaic cells, Raman scattering, Sputtering, Thin film devices",

author = "Cristina Insignares-Cuello and Victor Izquierdo-Roca and Xavier Fontane and Yudenia Sanchez and Juan Lopez-Garcia and Cedric Broussillou and Edgardo Saucedo and Veronica Bermudez and Alejandro Perez-Rodriguez",

year = "2013",

doi = "10.1109/PVSC.2013.6744410",

language = "English",

isbn = "9781479932993",

series = "Conference Record of the IEEE Photovoltaic Specialists Conference",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "1423--1426",

booktitle = "39th IEEE Photovoltaic Specialists Conference, PVSC 2013",

address = "United States",

note = "39th IEEE Photovoltaic Specialists Conference, PVSC 2013 ; Conference date: 16-06-2013 Through 21-06-2013",

}

Insignares-Cuello, C, Izquierdo-Roca, V, Fontane, X, Sanchez, Y, Lopez-Garcia, J, Broussillou, C, Saucedo, E, Bermudez, V & Perez-Rodriguez, A 2013, UV-Raman scattering assessment of ZnO:Al layers from Cu(In, Ga)Se ₂ based solar cells: Application for fast on-line process monitoring. in 39th IEEE Photovoltaic Specialists Conference, PVSC 2013., 6744410, Conference Record of the IEEE Photovoltaic Specialists Conference, Institute of Electrical and Electronics Engineers Inc., pp. 1423-1426, 39th IEEE Photovoltaic Specialists Conference, PVSC 2013, Tampa, FL, United States, 16/06/13. https://doi.org/10.1109/PVSC.2013.6744410

UV-Raman scattering assessment of ZnO:Al layers from Cu(In, Ga)Se ₂ based solar cells: Application for fast on-line process monitoring. / Insignares-Cuello, Cristina; Izquierdo-Roca, Victor; Fontane, Xavier et al.
39th IEEE Photovoltaic Specialists Conference, PVSC 2013. Institute of Electrical and Electronics Engineers Inc., 2013. p. 1423-1426 6744410 (Conference Record of the IEEE Photovoltaic Specialists Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - UV-Raman scattering assessment of ZnO:Al layers from Cu(In, Ga)Se 2 based solar cells

T2 - 39th IEEE Photovoltaic Specialists Conference, PVSC 2013

AU - Insignares-Cuello, Cristina

AU - Izquierdo-Roca, Victor

AU - Fontane, Xavier

AU - Sanchez, Yudenia

AU - Lopez-Garcia, Juan

AU - Broussillou, Cedric

AU - Saucedo, Edgardo

AU - Bermudez, Veronica

AU - Perez-Rodriguez, Alejandro

PY - 2013

Y1 - 2013

N2 - In this paper, we present a non destructive optical methodology based on the use of pre-resonant UV-Raman scattering measurements, which allows for the on-line fast characterization of ZnO:Al (AZO) transparent conductive oxide (TCO). The experimental data corroborate the possibility to obtain by this methodology reliable information about the electrical properties of the TCO layers. The UV-Raman spectra of AZO are characterized by the presence of a defect-induced band. The relative intensity of this band in the spectra shows a clear correlation with the TCO resistivity. This methodology has been tested in real case devices, showing its potential for its implementation as on-line control tool for TCO's in the photovoltaic industry.

AB - In this paper, we present a non destructive optical methodology based on the use of pre-resonant UV-Raman scattering measurements, which allows for the on-line fast characterization of ZnO:Al (AZO) transparent conductive oxide (TCO). The experimental data corroborate the possibility to obtain by this methodology reliable information about the electrical properties of the TCO layers. The UV-Raman spectra of AZO are characterized by the presence of a defect-induced band. The relative intensity of this band in the spectra shows a clear correlation with the TCO resistivity. This methodology has been tested in real case devices, showing its potential for its implementation as on-line control tool for TCO's in the photovoltaic industry.

KW - Electric resistance

KW - Photovoltaic cells

KW - Raman scattering

KW - Sputtering

KW - Thin film devices

UR - http://www.scopus.com/inward/record.url?scp=84896455462&partnerID=8YFLogxK

U2 - 10.1109/PVSC.2013.6744410

DO - 10.1109/PVSC.2013.6744410

M3 - Conference contribution

AN - SCOPUS:84896455462

SN - 9781479932993

T3 - Conference Record of the IEEE Photovoltaic Specialists Conference

SP - 1423

EP - 1426

BT - 39th IEEE Photovoltaic Specialists Conference, PVSC 2013

PB - Institute of Electrical and Electronics Engineers Inc.

Y2 - 16 June 2013 through 21 June 2013

ER -

Insignares-Cuello C, Izquierdo-Roca V, Fontane X, Sanchez Y, Lopez-Garcia J, Broussillou C et al. UV-Raman scattering assessment of ZnO:Al layers from Cu(In, Ga)Se ₂ based solar cells: Application for fast on-line process monitoring. In 39th IEEE Photovoltaic Specialists Conference, PVSC 2013. Institute of Electrical and Electronics Engineers Inc. 2013. p. 1423-1426. 6744410. (Conference Record of the IEEE Photovoltaic Specialists Conference). doi: 10.1109/PVSC.2013.6744410