VOC losses on CIS photovoltaic devices: Theoretical identification and quantification

C. M. Ruiz; V. Bermúdez

doi:10.1109/PVSC.2009.5411674

V_OC losses on CIS photovoltaic devices: Theoretical identification and quantification

C. M. Ruiz, V. Bermúdez

UMR 7174 CNRS

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Citation (Scopus)

Abstract

On this paper, we have studied the effect of the quality of different layers and their influence on the V_oc of a standard CISEL™ cell. The objective is to asset the magnitude of the global losses and to identify the responsibility of each layer on this final value. For this, we have carried several simulations with the SCAPS2.7.03 software. We propose a model for the standard cell, and then we substitute the optimal layers for another with known issues on the different materials. Then some experimental examples are compared with the model to validate it.

Original language	English
Title of host publication	2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	301-304
Number of pages	4
ISBN (Print)	9781424429509
DOIs	https://doi.org/10.1109/PVSC.2009.5411674
Publication status	Published - 2009
Externally published	Yes
Event	2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009 - Philadelphia, PA, United States Duration: 7 Jun 2009 → 12 Jun 2009

Publication series

Name	Conference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)	0160-8371

Conference

Conference	2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009
Country/Territory	United States
City	Philadelphia, PA
Period	7/06/09 → 12/06/09

Access to Document

10.1109/PVSC.2009.5411674

Cite this

Ruiz, C. M., & Bermúdez, V. (2009). V_OC losses on CIS photovoltaic devices: Theoretical identification and quantification. In 2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009 (pp. 301-304). Article 5411674 (Conference Record of the IEEE Photovoltaic Specialists Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2009.5411674

@inproceedings{4b3c1f33c4a24c9c885a20cdba14ef64,

title = "VOC losses on CIS photovoltaic devices: Theoretical identification and quantification",

abstract = "On this paper, we have studied the effect of the quality of different layers and their influence on the Voc of a standard CISEL{\texttrademark} cell. The objective is to asset the magnitude of the global losses and to identify the responsibility of each layer on this final value. For this, we have carried several simulations with the SCAPS2.7.03 software. We propose a model for the standard cell, and then we substitute the optimal layers for another with known issues on the different materials. Then some experimental examples are compared with the model to validate it.",

author = "Ruiz, {C. M.} and V. Berm{\'u}dez",

year = "2009",

doi = "10.1109/PVSC.2009.5411674",

language = "English",

isbn = "9781424429509",

series = "Conference Record of the IEEE Photovoltaic Specialists Conference",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "301--304",

booktitle = "2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009",

address = "United States",

note = "2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009 ; Conference date: 07-06-2009 Through 12-06-2009",

}

Ruiz, CM & Bermúdez, V 2009, V_OC losses on CIS photovoltaic devices: Theoretical identification and quantification. in 2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009., 5411674, Conference Record of the IEEE Photovoltaic Specialists Conference, Institute of Electrical and Electronics Engineers Inc., pp. 301-304, 2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009, Philadelphia, PA, United States, 7/06/09. https://doi.org/10.1109/PVSC.2009.5411674

V_OC losses on CIS photovoltaic devices: Theoretical identification and quantification. / Ruiz, C. M.; Bermúdez, V.
2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009. Institute of Electrical and Electronics Engineers Inc., 2009. p. 301-304 5411674 (Conference Record of the IEEE Photovoltaic Specialists Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - VOC losses on CIS photovoltaic devices

T2 - 2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009

AU - Ruiz, C. M.

AU - Bermúdez, V.

PY - 2009

Y1 - 2009

N2 - On this paper, we have studied the effect of the quality of different layers and their influence on the Voc of a standard CISEL™ cell. The objective is to asset the magnitude of the global losses and to identify the responsibility of each layer on this final value. For this, we have carried several simulations with the SCAPS2.7.03 software. We propose a model for the standard cell, and then we substitute the optimal layers for another with known issues on the different materials. Then some experimental examples are compared with the model to validate it.

AB - On this paper, we have studied the effect of the quality of different layers and their influence on the Voc of a standard CISEL™ cell. The objective is to asset the magnitude of the global losses and to identify the responsibility of each layer on this final value. For this, we have carried several simulations with the SCAPS2.7.03 software. We propose a model for the standard cell, and then we substitute the optimal layers for another with known issues on the different materials. Then some experimental examples are compared with the model to validate it.

UR - http://www.scopus.com/inward/record.url?scp=77951521918&partnerID=8YFLogxK

U2 - 10.1109/PVSC.2009.5411674

DO - 10.1109/PVSC.2009.5411674

M3 - Conference contribution

AN - SCOPUS:77951521918

SN - 9781424429509

T3 - Conference Record of the IEEE Photovoltaic Specialists Conference

SP - 301

EP - 304

BT - 2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009

PB - Institute of Electrical and Electronics Engineers Inc.

Y2 - 7 June 2009 through 12 June 2009

ER -